Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits
نویسندگان
چکیده
With the increase in the complexity of VLSI circuit design, logic design errors can occur during synthesis. In this work, we present a method for multiple design error diagnosis and correction. Our approach uses the results of test vector simulation for both error detection and error correction. This makes it applicable to circuits with no global BDD representation. In addition, diagnosis is performed through an implicit enumeration of potentially erroneous lines in an effort to avoid the exponential explosion of the error space. Experimental results on ISCAS'85 benchmark circuits show that our approach can typically detect and correct 1, 2 and 3 errors within seconds of CPU time.
منابع مشابه
Design error diagnosis and correction via test vector simulation
With the increase in the complexity of digital VLSI circuit design, logic design errors can occur during synthesis. In this work, we present a test vector simulation based approach for multiple design error diagnosis and correction. Diagnosis is performed through an implicit enumeration of the erroneous lines in an effort to avoid the exponential explosion of the error space as the number of er...
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